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投稿时间:2017-06-29 修订日期:2017-01-10
投稿时间:2017-06-29 修订日期:2017-01-10
中文摘要: 采用高频红外碳硫分析仪对高含量的碳化硅质耐火材料中的碳化硅含量进行分析。通过大量的条件实验,详尽地分析了影响测定结果的各种因素,并确定了实验的最佳条件。采用高含量的碳化硅C-2号标准样品以及碳化硅含量确定的样品1对分析结果进行校正。分别校正后碳化硅的测定值为81.74%和81.67%。通过化学分析方法进行比对(81.70%),测定结果准确、可信。
Abstract:High-frequency infrared carbon-sulfur (C/S) analyzer was used to analyze the silicon-carbide (SiC) content in SiC based refractory materials. By changing the experimental conditions, various factors affecting the analysis were examined, while the optimum experimental conditions were also established. The results were corrected by the standard samples: SiC, C-2 and the sample 1 for which the silicon carbide content was determined. The correction results were 81.74% and 81.67% respectively. The value determined by the chemical analysis was 81.70%, which shows that the results of the present experiment are accurate and credible.
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魏春阳,曾 静.高频红外碳硫分析仪对碳化硅质耐火材料中高含量碳化硅的测定[J].中国无机分析化学,2017,7(4):97-101.
WEI Chunyang,ZENG Jing.Determination of High Content SiC in Silicon-carbide Based Refractory Materials by High-Frequency Infrared C/S Analyzer[J].Chinese Journal of Inorganic Analytical Chemistry,2017,7(4):97-101.
魏春阳,曾 静.高频红外碳硫分析仪对碳化硅质耐火材料中高含量碳化硅的测定[J].中国无机分析化学,2017,7(4):97-101.
WEI Chunyang,ZENG Jing.Determination of High Content SiC in Silicon-carbide Based Refractory Materials by High-Frequency Infrared C/S Analyzer[J].Chinese Journal of Inorganic Analytical Chemistry,2017,7(4):97-101.