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| Rapid Determination of Silicon, Boron and Iron in FeSiB Amorphous Alloy Film by X-ray Fluorescence Spectrometry |
| Received:June 02, 2015 Revised:September 06, 2015 |
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| DOI：doi:10.3969/j.issn.2095-1035.2015.04.013 |
| KeyWord:X-ray fluorescence spectrometry (XRF); FeSiB amorphous alloy film; single point method; FeSiB alloy |
| Author | Institution |
| WANG Yao |
安泰科技股份有限公司，北京 |
| LI Yanping |
安泰科技股份有限公司，北京 |
| FENG Shengya |
安泰科技股份有限公司，北京 |
| LI Jianliang |
安泰科技股份有限公司，北京 |
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| Abstract: |
| With self-made standard samples and single spot method for drawing calibration curves, a method for the determination of silicon, boron and iron in FeSiB amorphous alloy film byX-ray fluorescence spectrometry was proposed. Under the optimum analytical conditions, the contents of silicon, boron and iron in 4 FeSiB amorphous alloy film samples were determined. The relative standard deviations (RSDs, n=10) for silicon, boron and iron were 0.4%~0.5%, 1.3%~4.2% and 0.2%~0.4%, respectively. The analytical results obtained by the proposed method were in good accordance with those obtained by spark source atomic emission spectormetry, chemical gravimetric method and ICP-AES. The method is rapid, simple without film sample preparation. Therefore, it can be used for the component analysis in FeSiB amorphous alloy film samples. |
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