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| Fast,accurate determination of major elements and minor elements in sodium silicate by X-ray fluorescence spectrometer |
| Received:January 04, 2018 Revised:January 29, 2018 |
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| DOI：doi:10.3969/j.issn.2095-1035.2018.03.009 |
| KeyWord:X-ray fluorescence spectrometer;sodium silicate accuracy;precision |
| Author | Institution |
| Zhou Zheng |
四川西冶新材料股份有限公司 |
| Wang Ji |
四川西冶新材料股份有限公司 |
| Sun Rong |
四川西冶地质测试技术有限公司 |
| Zheng Ruo Feng |
四川西冶新材料股份有限公司 |
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| Abstract: |
| This paper introduces the determination methods of Al2O3、CaO、MgO、Fe2O3、K2O、Na2O、SiO2 in sodium silicate by X ray fluorescence spectrometer.The sample preparation method and the instrument analysis parameters suitable for direct determination of sodium silicate are studied, and the working curve is set up and entered into the database.Comparing the determination results of the unknown samples with the chemical methods and the ICP-AES method, it is proved that the method has good accuracy and precision test shows that RSD is between 0.38%~14.26%.The results show that the accuracy and precision of this method can fully satisfy the determination of the above elements in sodium silicate. |
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