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| The current state of technological development in data processing algorithms for Single Particle-Inductively Coupled Plasma Mass Spectrometry (SP-ICP-MS) |
| Received:October 11, 2023 Revised:January 14, 2024 |
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| DOI：10.3969/j.issn.2095-1035.2024.07.006 |
| KeyWord:SP-ICP-MS;Single particle;Mass spectrometry;Analytical technique;Data processing algorithm;Review |
| Author | Institution |
| Lin Xian |
杭州谱育科技发展有限公司 |
| Yan Neng |
中国地质大学武汉）环境学院 |
| Yang Yan |
杭州谱育科技发展有限公司 |
| Wu Zhiwei |
杭州谱育科技发展有限公司 |
| Xu Yue |
杭州谱育科技发展有限公司 |
| Yu Xiaofeng |
杭州谱育科技发展有限公司 |
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| Abstract: |
| Single particle inductively coupled plasma-mass spectrometry (SP-ICP-MS) integrates high-throughput particle counting technology with time-resolved ICP-MS analysis, enabling the efficient and rapid characterization of individual particles. This method not only provides information on the mass and size of individual particles, but also enables the determination of total particle number concentration, particle size distribution, and measurement of elemental content in both dissolved and particulate states simultaneously. Over the course of more than two decades of development, SP-ICP-MS has emerged as a crucial technique for characterizing single particles. Its substantial technical advantages have garnered considerable attention, and numerous researchers in the field have made noteworthy advancements in exploring its analytical methods, data acquisition techniques, and data processing algorithms. This article comprehensively reviews the technical approaches, data processing algorithms, and research progress in characterizing nanoparticles using SP-ICP-MS. It specifically focuses on the crucial issues in single-particle quantitative analysis and provides insights into future research directions. However, it is important to note that the current analysis of SP-ICP-MS in different application still lacks clear and unified algorithms for particle event identification, determination thresholds for solution signals, quality control for particle signals, and precise methods for particle quantification (such as quantifying particle number concentration, particle mass concentration, and particle average/median size). A lack of universally applicable data processing approaches poses challenges in achieving accurate quantification in the wide range of nanoparticle applications using SP-ICP-MS technology. |
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